Efficiency |R0(θ)|2 corresponding to the specularly reflected
order and for different values of h/d in the range 0.005–0.030. |
|
Map of |R0(θ)|2 as a function of θ and h/d. When
h/d is increased from 0.03 (maximum value in the above figure), the maximum value of the reflectivity reaches a increasingly larger value. The introduction of a weak corrugation in an poorly reflecting surface, produces high reflectivities in angular regions corresponding to ESW excitation. For example, when h/d=0.06, the surface reflects 85 % of the incident power. |
|
Map |R-1(θ)| as a function of θ and h/d. Contrary to
the behavior found in the previously described regimes (After total reflection ), we observed that the amplitude of the evanescent order,which is phase matched with the ESW, does not take its maximum value under the same conditions where maximal absorption of the incident wave occurs, a feature that should prevent us from obtaining maps of the ESW dispersion relation by optically detecting the angular position of the minima, as is of common use in conventional prism and grating couplers. |